Dwayne Ward

Title: Dwayne Ward: Innovator in CAM Test Structures

Introduction

Dwayne Ward is a notable inventor based in McKinney, TX (US). He has made significant contributions to the field of computer architecture, particularly in the area of content-addressable memory (CAM) testing. His innovative approach has led to the development of a patent that enhances the efficiency of testing CAM-specific circuitry.

Latest Patents

Dwayne Ward holds a patent titled "CAM test structures and methods therefor." This invention focuses on configurations and methods that enable the testing of CAM-specific circuitry, even in the presence of defective memory. By utilizing various test modes, the CAM can be debugged to isolate memory failures from priority encoder failures. This innovation significantly reduces the need for design changes and provides the ability to test CAM functions very efficiently, thereby reducing test time. He has 1 patent to his name.

Career Highlights

Dwayne Ward is currently employed at Texas Instruments Corporation, where he applies his expertise in developing advanced testing methodologies. His work has contributed to the improvement of CAM technology, making it more reliable and efficient for various applications.

Collaborations

Dwayne has collaborated with notable colleagues, including George Ernest Harris and Bryan David Sheffield. Their combined efforts have fostered innovation and advancement in the field of electronics.

Conclusion

Dwayne Ward's contributions to CAM testing represent a significant advancement in the field of computer architecture. His innovative patent not only enhances testing efficiency but also reduces the need for extensive design changes. His work continues to impact the industry positively.