Duck Mahn Oh

Title: Duck Mahn Oh: Innovator in Scanning Probe Technology

Introduction

Duck Mahn Oh is a prominent inventor based in Suwon-si, South Korea. He is known for his contributions to the field of scanning probe technology. His innovative work has led to the development of a unique scanning probe inspector that enhances the efficiency of wafer inspection processes.

Latest Patents

Duck Mahn Oh holds a patent for a scanning probe inspector. This invention comprises a probe that includes a cantilever and a tip whose length corresponds to the depth of a trench formed in a wafer. The scanning probe inspector features a trench detector that acquires location information of the trench, including depth information. Additionally, a controller is included that inserts the tip into a first point where a trench exists based on the location information and moves the tip through the trench. Furthermore, a defect detector is integrated to identify the presence of defects in the sidewall of the trench as the tip is moved through it. This innovative technology significantly improves the accuracy and reliability of wafer inspections.

Career Highlights

Duck Mahn Oh is currently employed at Samsung Electronics Co., Ltd., a leading global technology company. His work at Samsung has allowed him to collaborate with other talented professionals in the field.

Collaborations

Some of his notable coworkers include Sung Yoon Ryu and Young Hoon Sohn. Their collaborative efforts contribute to the advancement of technology within the company.

Conclusion

Duck Mahn Oh's innovative contributions to scanning probe technology exemplify the importance of research and development in the tech industry. His patent for the scanning probe inspector showcases his commitment to enhancing wafer inspection processes. His work continues to influence advancements in the field, making him a significant figure in the world of inventions.