Company Filing History:
Years Active: 2008
Title: Innovations by Dragisha Miladinovic in High-Resolution Measurement Techniques
Introduction
Dragisha Miladinovic is an accomplished inventor based in Deniston, Australia. He has made significant contributions to the field of metrology, particularly in the measurement of aspheric surfaces. His innovative approach has led to the development of a patented method that enhances the accuracy of high-resolution measurements.
Latest Patents
Miladinovic holds a patent for a "Method for accurate high-resolution measurements of aspheric surfaces." This system comprises a plurality of methods designed to measure surfaces or wavefronts from a test part with greatly improved accuracy, especially concerning higher spatial frequencies on aspheres. The methods involve multiple measurements of a test part, with one method focusing on the calibration and control of the focusing components of a metrology gauge. This calibration is crucial to avoid loss of resolution and accuracy when the test part is repositioned with respect to the gauge. Other methods extend conventional averaging techniques to suppress the higher spatial-frequency structure in the gauge's inherent slope-dependent inhomogeneous bias. These methods can be tailored to specific geometries and tasks, showcasing Miladinovic's innovative approach to metrology.
Career Highlights
Miladinovic is associated with QED Technologies International, Inc., where he applies his expertise in metrology. His work has been instrumental in advancing measurement techniques that are critical for various applications in optics and engineering. His dedication to innovation has positioned him as a key figure in his field.
Collaborations
Throughout his career, Miladinovic has collaborated with notable colleagues, including Paul Murphy and Greg W. Forbes. These collaborations have further enriched his work and contributed to the development of advanced measurement techniques.
Conclusion
Dragisha Miladinovic's contributions to high-resolution measurement techniques exemplify the impact of innovative thinking in metrology. His patented methods not only enhance accuracy but also pave the way for future advancements in the field.