Conroe, TX, United States of America

Doug Heerman


Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 2012

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Doug Heerman - Innovator in Hypervelocity Impact Detection

Introduction

Doug Heerman is a notable inventor based in Conroe, TX (US). He is recognized for his innovative contributions to the field of hypervelocity impact detection. With a focus on advanced detection methods, Heerman has made significant strides in understanding and measuring impacts on various surfaces.

Latest Patents

Heerman holds 1 patent for his invention titled "Hypervelocity impact and time of arrival detection method and system." This patent describes a method and system that utilizes multiple sensors to directly measure electrical pulse radio frequency (RF) emissions generated by hypervelocity impacts. The system also incorporates time of arrival (TOA) position measurements to determine the precise impact location on the detection surface. The unique design of the detection surface material allows for differential compression, which directs the inherent equalization of compressed electron density to uncompressed areas, generating an electrical current that flows until the redistribution of electrical charge is complete.

Career Highlights

Heerman's career is marked by his dedication to advancing detection technologies. His work has contributed to improved safety and understanding in various applications where hypervelocity impacts are a concern. His innovative approach has set a benchmark in the field.

Collaborations

Heerman has collaborated with notable colleagues, including Karl F Kiefer and Brian D Philpot. These partnerships have fostered a collaborative environment that enhances the development of cutting-edge technologies.

Conclusion

Doug Heerman's contributions to hypervelocity impact detection exemplify the spirit of innovation. His work not only advances technology but also enhances safety and understanding in critical applications.

This text is generated by artificial intelligence and may not be accurate.
Please report any incorrect information to support@idiyas.com
Loading…