Poughquag, NY, United States of America

Donald W Scheider


Average Co-Inventor Count = 7.0

ph-index = 1


Company Filing History:


Years Active: 2003

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Donald W. Scheider

Introduction

Donald W. Scheider is a notable inventor based in Poughquag, NY (US). He has made significant contributions to the field of integrated circuit technology. His work primarily focuses on enhancing the performance and reliability of electronic components.

Latest Patents

One of his key patents is titled "Corrosion-resistant electrode structure for integrated circuit decoupling capacitors." This invention addresses the need for a corrosion-resistant electrode structure that interconnects a decoupling capacitor to a substrate. In an exemplary embodiment, the electrode structure includes a first chromium layer formed upon the capacitor, followed by a first nickel layer. A noble metal conductive layer is then formed upon the first nickel layer, with a second nickel layer that is thicker than the first. Finally, a second chromium layer is formed upon the nickel layer. This innovative design enhances the durability and efficiency of integrated circuits.

Career Highlights

Donald W. Scheider is associated with the International Business Machines Corporation, commonly known as IBM. His work at IBM has allowed him to contribute to various advancements in technology, particularly in the realm of electronic components.

Collaborations

Throughout his career, Scheider has collaborated with notable colleagues, including Bruce Anthony Copeland and Rebecca Yung Gorrell. These collaborations have fostered an environment of innovation and creativity, leading to significant advancements in their respective fields.

Conclusion

Donald W. Scheider's contributions to the field of integrated circuits through his innovative patents and collaborations highlight his importance as an inventor. His work continues to influence the technology landscape, ensuring enhanced performance and reliability in electronic components.

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