Location History:
- Maple Grove, MN (US) (1986)
- Hennepin, MN (US) (1988)
Company Filing History:
Years Active: 1986-1988
Title: The Innovations of Donald A. Eide
Introduction
Donald A. Eide is a notable inventor based in Maple Grove, MN (US). He has made significant contributions to the field of inspection apparatus technology, holding a total of 2 patents. His work has been instrumental in advancing the capabilities of video signal processing and inspection systems.
Latest Patents
Eide's latest patents include the "Chroma responsive inspection apparatus selectively producing analog." This innovative inspection apparatus is designed to respond selectively to various components of a composite color signal, including hue, saturation, and intensity. The output signal produced can be utilized by a signal image processor to generate suitable gray-scale images for effective operation of the inspection system. Another significant patent is the "Circuit for converting the phase encoded hue information of a quadrature." This invention combines apparatus that isolates chroma information from a quadrature modulated color subcarrier video signal and transforms it into an analog voltage. This voltage has distinguishable levels that uniquely represent different hues of the composite signal.
Career Highlights
Donald A. Eide is associated with Honeywell GmbH, where he applies his expertise in developing advanced technologies. His work at Honeywell has allowed him to contribute to various innovative projects that enhance the functionality of inspection systems.
Collaborations
Eide has collaborated with notable colleagues, including Curtis J. Bocchi and Rebecca A. Hart. These collaborations have fostered a creative environment that encourages the development of cutting-edge technologies.
Conclusion
Donald A. Eide's contributions to the field of inspection apparatus technology are noteworthy. His patents reflect a commitment to innovation and excellence in engineering. His work continues to influence advancements in video signal processing and inspection systems.