Southlake, TX, United States of America

Don J Weeks


Average Co-Inventor Count = 4.6

ph-index = 7

Forward Citations = 188(Granted Patents)


Location History:

  • Southlake, US (1991)
  • Southlake, TX (US) (1990 - 1997)

Company Filing History:


Years Active: 1990-1997

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9 patents (USPTO):Explore Patents

Title: Don J Weeks: Innovator in Laser Pattern Inspection Technology

Introduction

Don J Weeks is a prominent inventor based in Southlake, TX (US), known for his significant contributions to laser pattern inspection technology. With a total of 9 patents to his name, Weeks has made a notable impact in the field of precision engineering and inspection systems.

Latest Patents

Weeks' latest patents include a groundbreaking invention titled "Laser pattern/inspector with a linearly ramped chirp deflector." This innovative system is designed to write or inspect patterns on a target by raster scanning the target pixels. The inspection can also be performed using substage illumination with non-laser light. The system utilizes a database organized into frames and strips, representing an ideal pattern as one or more polygons. Each polygon's data description is contained within a single data frame. The database undergoes several transformations, including turnpoint polygon representation, left and right vector representation, addressed pixel representation, and a bit-mapped representation of the entire target. Most of these transformations are executed in parallel pipelines, enhancing efficiency. Guardbands around polygon sides are employed for error filtering during inspection, ensuring high accuracy. The system also features an autofocus mechanism that keeps the scanning laser beam in focus on the target, facilitating precise inspections.

Career Highlights

Weeks has had a distinguished career at Texas Instruments Corporation, where he has been instrumental in developing advanced inspection technologies. His work has significantly contributed to the company's reputation as a leader in the field of electronics and precision measurement.

Collaborations

Throughout his career, Weeks has collaborated with notable colleagues, including William G Manns and Anthony B Wood. These partnerships have fostered innovation and have led to the development of cutting-edge technologies in laser pattern inspection.

Conclusion

Don J Weeks is a remarkable inventor whose work in laser pattern inspection technology has advanced the field significantly. His contributions continue to influence the industry, showcasing the importance of innovation in engineering.

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