Company Filing History:
Years Active: 2014-2018
Title: Don J Lee: Innovator in Material Identification Technology
Introduction
Don J Lee is a notable inventor based in Concord, MA (US). He has made significant contributions to the field of material identification through his innovative technologies. With a total of 3 patents to his name, Lee has focused on developing methods that enhance the identification of solid and liquid materials.
Latest Patents
One of Lee's latest patents is an optical analyzer for the identification of materials using transmission spectroscopy. This device employs near-infrared transmission spectroscopy combined with multivariate calibration methods for analyzing spectral data. The technology operates within the 700-1100 nm or 900-1700 nm wavelength range to identify materials and determine their match with specific known substances. The analyzer is capable of identifying both solid (including powdered) and liquid materials with a rapid measurement cycle time of approximately 2 to 15 seconds. Notably, this method requires no sample preparation and allows for quantitative analysis to determine the concentration of one or more chemical components in a mixture. A primary application of this technology is the detection of counterfeit drug tablets, capsules, and liquid medications.
Career Highlights
Don J Lee is associated with Innovative Science Tools, Inc., where he continues to develop and refine his inventions. His work has significantly impacted the field of material analysis, particularly in applications that require rapid and accurate identification of substances.
Collaborations
Lee collaborates with Ronald H Micheels, contributing to advancements in their shared field of expertise.
Conclusion
Don J Lee's innovative work in material identification technology showcases his commitment to enhancing safety and accuracy in various applications. His contributions are vital in the ongoing fight against counterfeit medications and improving material analysis methods.