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Years Active: 2018
Title: The Innovative Contributions of Dimitrios Ntarlagiannis
Introduction
Dimitrios Ntarlagiannis is a notable inventor based in River Edge, NJ (US). He has made significant contributions to the field of geophysics through his innovative patent. His work focuses on enhancing the measurement techniques used in spectral induced polarization studies.
Latest Patents
Dimitrios holds a patent for an "Intelligent spectral induced polarization measurement module." This system is designed for spectral induced polarization measurement of geological formations. It features an intelligent module that performs spectral induced polarization (SIP) measurements, which are crucial for geophysical studies. The system includes an instrument with a housing that can be inserted into a surface opening. Inside the housing, a signal generator creates an excitation signal, which is directed into the surrounding material by a drive electrode. A series of electrodes then sense the voltage and/or current in the adjacent material, while a processor analyzes this data to measure the material's properties. Additionally, the system allows for the interconnection of multiple instruments to facilitate communication, synchronization, and power sharing.
Career Highlights
Throughout his career, Dimitrios has worked with various organizations, including Ontash & Ermac, Inc. and Rutgers, the State University of New Jersey. His experience in these institutions has contributed to his expertise in the field of geophysics and measurement technologies.
Collaborations
Dimitrios has collaborated with notable professionals in his field, including Lee Slater and Frank Curatola. These collaborations have further enriched his work and contributed to advancements in spectral induced polarization measurement techniques.
Conclusion
Dimitrios Ntarlagiannis is a distinguished inventor whose work in spectral induced polarization measurement has made a significant impact in geophysical studies. His innovative patent and collaborations highlight his commitment to advancing measurement technologies.