Neu-Ulm, Germany

Detief Sanchen


Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2012

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1 patent (USPTO):Explore Patents

Title: The Innovations of Detief Sanchen

Introduction

Detief Sanchen is a notable inventor based in Neu-Ulm, Germany. He has made significant contributions to the field of microscopy, particularly with his innovative designs and patents. His work has been instrumental in advancing the capabilities of scanning probe microscopes.

Latest Patents

Detief Sanchen holds a patent for a "Scanning probe in pulsed-force mode, digital and in real time." This invention pertains to a microscope, specifically a scanning probe microscope, that incorporates a programmable logic device. This technology enhances the precision and functionality of microscopy, allowing for more detailed and accurate measurements.

Career Highlights

Detief Sanchen is currently employed at Witec Wissenschaftliche Instrumente und Technologie GmbH. His role at the company allows him to work on cutting-edge technologies that push the boundaries of scientific research and instrumentation. His expertise in the field has led to advancements that benefit various scientific disciplines.

Collaborations

Detief has collaborated with notable colleagues, including Peter Spizig and Jörg Förstner. These partnerships have fostered an environment of innovation and creativity, leading to the development of new technologies and methodologies in microscopy.

Conclusion

Detief Sanchen's contributions to the field of microscopy through his patent and work at Witec Wissenschaftliche Instrumente und Technologie GmbH highlight his role as a key innovator. His advancements in scanning probe technology continue to influence scientific research and instrumentation.

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