Company Filing History:
Years Active: 1991-1996
Title: Dennis C. Walters: Innovator in Nondestructive Measurement Techniques
Introduction
Dennis C. Walters is a notable inventor based in Fairborn, OH (US). He has made significant contributions to the field of materials science, particularly in the nondestructive measurement of dislocation density in Gallium Arsenide (GaAs) wafers. With a total of 2 patents, his work has implications for the semiconductor industry and beyond.
Latest Patents
One of Walters' latest patents is a method for nondestructive measurement of dislocation density in GaAs. This innovative technique involves testing an unetched GaAs wafer for fractional transmission of light at various points across its surface. By calculating the absorption coefficient from the detected values, regions of dislocation density can be identified without damaging the wafer. This method allows for a clear distinction between dislocated and undislocated regions, enhancing the understanding of material properties.
Another significant patent by Walters is a method and system for automated measurement of whole-wafer etch pit density. This system measures the fractional transmission of light through an etched GaAs wafer and utilizes computer algorithms to convert transmission data directly into etch pit density. This advancement streamlines the process of assessing wafer quality, which is crucial for semiconductor manufacturing.
Career Highlights
Walters is associated with the United States of America as represented by the Secretary of the Air Force. His work has been instrumental in advancing techniques that improve the quality and reliability of semiconductor materials. His innovative approaches have garnered attention in both academic and industrial circles.
Collaborations
Throughout his career, Walters has collaborated with esteemed colleagues such as David C. Look and Millard G. Mier. These partnerships have fostered a collaborative environment that encourages the exchange of ideas and expertise, further enhancing the impact of their collective work.
Conclusion
Dennis C. Walters stands out as a pioneering inventor in the field of nondestructive measurement techniques. His contributions have significantly advanced the understanding and quality of semiconductor materials, making a lasting impact on the industry.