Company Filing History:
Years Active: 1989
Title: The Innovations of Dean E. Twedt
Introduction
Dean E. Twedt is a notable inventor based in Miami, Florida, recognized for his contributions to the field of analytical instrumentation. He has developed a unique patent that enhances the evaluation of instrument performance, precision, and accuracy. His work has significant implications for laboratories that rely on analytical instruments for precise measurements.
Latest Patents
Dean E. Twedt holds a patent for an "Interlaboratory Quality Assurance Program." This innovative procedure statistically evaluates the performance of analytical instruments by comparing one instrument's performance in a laboratory with that of similar instruments in other laboratories. The process involves quantitatively analyzing a reference specimen by each instrument and collecting data to compute a sensitive index known as the 'Instrument Performance Index' or IPI. This index allows operators to quickly assess the precision and accuracy of instruments, making it a valuable tool in laboratory settings.
Career Highlights
Twedt's career is marked by his association with Coulter Electronics, Inc., where he has applied his expertise in analytical instrumentation. His work has contributed to advancements in quality assurance programs, enhancing the reliability of laboratory results. His innovative approach has set a standard for evaluating instrument performance across various laboratories.
Collaborations
Dean E. Twedt has collaborated with Frank C. Anderson, furthering the development of quality assurance methodologies in analytical instrumentation. Their partnership has led to significant advancements in the field, promoting better practices in laboratory evaluations.
Conclusion
Dean E. Twedt's contributions to the field of analytical instrumentation through his innovative patent have established him as a key figure in quality assurance programs. His work continues to influence laboratory practices, ensuring precision and accuracy in analytical measurements.