Company Filing History:
Years Active: 2004
Title: David W. Lagrow: Innovator in Electromagnetic Interference Detection
Introduction
David W. Lagrow is a notable inventor based in Fort Wayne, Indiana. He has made significant contributions to the field of electromagnetic interference (EMI) detection. His innovative approach has led to the development of a unique patent that enhances the analysis of EMI levels.
Latest Patents
David W. Lagrow holds a patent for "Methods and apparatus for detecting electromagnetic interference." This patent describes an EMI testing scheme that involves analyzing an analog input signal in frequency band segments. The input signal is passband filtered and digitally sampled before being converted to a complex analytic signal via a Hilbert transform filter. It is then transformed into a frequency domain signal using a Discrete Fourier Transform (DFT). Pre-stored frequency window filters are applied to the frequency domain signal, allowing for the selection of particular frequency sub-bands for EMI analysis. By applying different frequency window filters, various frequency sub-bands can be sequentially selected for analysis. An inverse DFT transforms the filtered signal back to the time domain, where the peak voltage of the time domain signal is compared with a threshold to determine whether EMI levels within the selected sub-band are acceptable.
Career Highlights
David W. Lagrow is currently employed at Itt Manufacturing Enterprises, Inc. His work focuses on advancing technologies related to EMI detection and analysis. He has demonstrated a commitment to innovation and excellence in his field.
Collaborations
David collaborates with Michael Mayor, who is also involved in the same field. Their partnership contributes to the development of advanced solutions for EMI detection.
Conclusion
David W. Lagrow's contributions to the field of electromagnetic interference detection exemplify the spirit of innovation. His patent and ongoing work at Itt Manufacturing Enterprises, Inc. highlight his dedication to improving technology in this critical area.