Burke, VA, United States of America

David R Kaplan


Average Co-Inventor Count = 2.1

ph-index = 4

Forward Citations = 118(Granted Patents)


Company Filing History:


Years Active: 1991-1995

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7 patents (USPTO):Explore Patents

Title: David R Kaplan: Innovator in Infrared Detection Technology

Introduction

David R Kaplan is a notable inventor based in Burke, VA (US), recognized for his contributions to infrared detection technology. With a total of 7 patents, Kaplan has made significant advancements in the field, particularly in the development of testing systems for infrared detectors.

Latest Patents

Among his latest patents is the "Focal Plane Array Test Facility," which is a sophisticated test system designed to fully characterize various types of infrared and ar-infrared detector arrays used in FLIR imagers. This innovative system employs multiple radiation sources, array supports, radiation filters, and radiation stops, all of which are remotely controlled and positioned by a computer. The computer not only performs the tests but also sorts the collected data and presents the results in various formats. Another significant patent is the "Flexible Membrane Circuit Tester," which features a pattern of electrodes carried by a thin-film membrane mounted on a frame. This design allows for testing circuits by utilizing air pressure to push the membrane against test points, enabling capacitive coupling between the electrodes and the test points.

Career Highlights

David R Kaplan is currently employed by the US Government as represented by the Secretary of the Army. His work focuses on advancing technologies that enhance the capabilities of infrared detection systems. His innovative approaches have led to the development of critical testing methodologies that improve the reliability and performance of infrared detectors.

Collaborations

Kaplan has collaborated with notable colleagues, including Brian S Miller and Christopher R Costanzo, contributing to the advancement of technology in their respective fields.

Conclusion

David R Kaplan's work in infrared detection technology exemplifies innovation and dedication to improving testing methodologies. His patents reflect a commitment to enhancing the capabilities of infrared systems, making significant contributions to the field.

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