David Ohana

Title: David Ohana: Innovator in Anomaly Detection Technologies

Introduction

David Ohana is a prominent inventor based in Haifa, Israel. He has made significant contributions to the field of anomaly detection, holding a total of 2 patents. His work focuses on improving the accuracy and explainability of systems through innovative techniques.

Latest Patents

David Ohana's latest patents include "Hierarchical evaluation of multivariate anomaly level" and "Systems and methods for anomaly detection in a distributed computing system." The first patent outlines techniques for hierarchical evaluation of the anomaly level of a system and its sub-components using domain knowledge. This method aims to enhance accuracy compared to conventional methods by defining a tree-like topological structure that represents the hierarchical computer network. The second patent provides a system for identifying system-level anomalies by clustering data-points indicative of the dynamic state of processing nodes in a distributed system. This system computes anomaly scores and generates alerts for anomalous events.

Career Highlights

David Ohana is currently employed at International Business Machines Corporation (IBM), where he continues to develop innovative solutions in the field of anomaly detection. His work has garnered attention for its potential to improve operational efficiency in complex systems.

Collaborations

David collaborates with notable colleagues, including Bruno Wassermann and Nir Rozenbaum, who contribute to his research and development efforts.

Conclusion

David Ohana's contributions to anomaly detection technologies reflect his commitment to innovation and excellence in his field. His patents demonstrate a forward-thinking approach that addresses the challenges of modern computing systems.