Company Filing History:
Years Active: 2003-2004
Title: Innovations by David Muradian
Introduction
David Muradian is an accomplished inventor based in Yerevan, Armenia. He holds a total of 2 patents that showcase his expertise in the field of defect inspection in integrated circuits. His innovative methods have contributed significantly to the advancement of technology in this area.
Latest Patents
One of his latest patents is titled "Correction of overlay offset between inspection layers." This method involves determining the origins of a coordinate system used for different defect inspection spaces. The process includes collecting multiple data sets, filtering out noise, and calculating coordinate offsets based on correlated data sets. Another notable patent is "Correction of overlay offset between inspection layers in integrated circuits." This method focuses on determining offsets between coordinate systems used for inspecting defects on integrated circuit wafers. It involves creating a database of defect location data, defining maximum offsets, and calculating actual offsets for interlayer defect pairs.
Career Highlights
David has worked with several notable companies, including HPL Technologies, Inc. and Neuristics Physics Laboratory, Inc. His experience in these organizations has allowed him to refine his skills and contribute to significant advancements in technology.
Collaborations
Throughout his career, David has collaborated with professionals such as John M. Caywood and Brian Duffy. These collaborations have further enriched his work and led to innovative solutions in the field of defect inspection.
Conclusion
David Muradian's contributions to the field of integrated circuits through his patents and collaborations highlight his role as a significant inventor. His innovative methods continue to influence the industry and pave the way for future advancements.