David M Keathly

Title: The Innovative Contributions of David M. Keathly

Introduction

David M. Keathly is a notable inventor based in Dallas, TX (US). He has made significant contributions to the field of print inspection technology. His innovative approach has led to the development of a unique method for determining the quality of print using pixel intensity levels.

Latest Patents

David M. Keathly holds a patent for a method titled "Method for determining the quality of print using pixel intensity level." This print inspection method involves optically scanning an area of printed material to obtain image data representing picture elements with variable intensity levels. The process includes counting the number of picture elements at a specific intensity level to generate a frequency distribution of the intensity levels in the scanned area. This frequency distribution is then compared to a stored reference frequency distribution of intensity levels. A statistical comparison with the reference data is utilized to determine whether the printed material meets quality standards.

Career Highlights

David is currently employed at Comar, Inc., where he continues to apply his expertise in print technology. His work has been instrumental in enhancing the quality control processes within the printing industry. With a focus on innovation, he has contributed to advancements that improve the reliability and accuracy of print inspections.

Collaborations

David has collaborated with several professionals in his field, including John K. Anderson and Michael S. Andrews. These partnerships have fostered a collaborative environment that encourages the exchange of ideas and the development of cutting-edge technologies.

Conclusion

David M. Keathly's contributions to print inspection technology exemplify the impact of innovation in enhancing quality control processes. His patented method showcases his commitment to improving industry standards and ensuring the reliability of printed materials.