San Jose, CA, United States of America

David Junwei Tse

USPTO Granted Patents = 1 

Average Co-Inventor Count = 9.0

ph-index = 1

Forward Citations = 25(Granted Patents)


Company Filing History:


Years Active: 2017

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of David Junwei Tse

Introduction

David Junwei Tse is a notable inventor based in San Jose, California. He has made significant contributions to the field of technology, particularly in the area of device health metrics. His work focuses on improving the reliability and performance of devices through innovative methods of data collection and aggregation.

Latest Patents

David holds a patent for the "Collection and aggregation of device health metrics." This patent outlines a method for collecting and aggregating device health metrics before sending them to a server for further analysis. The process includes determining when a crash has occurred on a device and recording relevant information in buffer storage. It also involves grouping multiple crash events based on their type and generating comprehensive device health metrics data. This data is then sent to a server for further aggregation, enhancing the overall understanding of device performance.

Career Highlights

David Junwei Tse is currently employed at Amazon Technologies, Inc. His role involves leveraging his expertise in device health metrics to contribute to the development of advanced technologies. His innovative approach has led to the creation of solutions that improve device reliability and user experience.

Collaborations

David has collaborated with talented individuals such as Yuzhi Zhang and Rafael Camargo. These collaborations have fostered a creative environment that encourages the development of groundbreaking technologies.

Conclusion

David Junwei Tse's contributions to the field of technology, particularly through his patent on device health metrics, demonstrate his commitment to innovation. His work at Amazon Technologies, Inc. continues to influence the way devices are monitored and improved.

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