David J Sandoz

Title: Innovations by David J Sandoz

Introduction

David J Sandoz is a notable inventor based in Gwynedd, GB. He has made significant contributions to the field of industrial process monitoring through his innovative approaches. His work focuses on enhancing the sensitivity and interpretability of statistical monitoring techniques.

Latest Patents

David J Sandoz holds a patent for "Multivariate statistical process monitors - An extended partial least squares (EPLS) approach for the condition monitoring of industrial processes." This patent describes an EPLS approach that provides two statistical monitoring charts to detect abnormal process behavior, along with contribution charts to diagnose this behavior. The theoretical analysis of the EPLS monitoring charts is accompanied by two application studies, demonstrating that the EPLS approach is either more sensitive or offers easier interpretation than conventional PLS methods. Generalized scores are calculated by constructing an augmented matrix, which aids in the effective monitoring of industrial processes.

Career Highlights

Throughout his career, David has been dedicated to advancing the field of statistical process monitoring. His innovative methods have garnered attention for their practical applications in various industrial settings.

Collaborations

David has collaborated with notable professionals in his field, including Uwe Kruger and Qian Chen. Their combined expertise has contributed to the development of advanced monitoring techniques.

Conclusion

David J Sandoz's contributions to industrial process monitoring through his patent and collaborative efforts highlight his role as an influential inventor in the field. His work continues to impact the way industries monitor and diagnose process behaviors effectively.