Company Filing History:
Years Active: 1990-1991
Title: David J Hutson: Innovator in E-beam Testing Technology
Introduction
David J Hutson is a notable inventor based in Apalachin, NY (US). He has made significant contributions to the field of electronic testing, particularly through his innovative methods for opens and shorts testing of capacitively coupled networks. With a total of 2 patents, Hutson's work has advanced the capabilities of E-beam testing systems.
Latest Patents
Hutson's latest patents include a method for opens/shorts testing of capacitively coupled networks. This E-beam testing system utilizes an electron beam to test samples with conductive elements. The system charges these conductive elements and employs a stacked pair of parallel extraction grids to control the emission of secondary electrons. The method involves applying an unfocused flood electron beam to a broad surface while simultaneously using a focused probe electron beam to detect electrical connections and short circuits without physical contact.
Career Highlights
David J Hutson is currently associated with International Business Machines Corporation (IBM). His work at IBM has allowed him to develop and refine his innovative testing methods, contributing to the company's reputation for technological advancement.
Collaborations
Hutson has collaborated with notable coworkers such as Steven D Golladay and Fritz J Hohn. Their combined expertise has further enhanced the development of E-beam testing technologies.
Conclusion
David J Hutson's contributions to E-beam testing technology exemplify his innovative spirit and dedication to advancing electronic testing methods. His patents reflect a commitment to improving the accuracy and efficiency of testing systems in the industry.