Campbell, CA, United States of America

David J Harney


Average Co-Inventor Count = 11.0

ph-index = 1

Forward Citations = 25(Granted Patents)


Company Filing History:

goldMedal1 out of 832,680 
Other
 patents

Years Active: 1992

Loading Chart...
1 patent (USPTO):

Title: David J. Harney: Innovator in Optical Inspection Technology

Introduction: David J. Harney, a prominent inventor based in Campbell, California, is renowned for his groundbreaking contributions to optical inspection technology. With a single patent to his name, Harney has developed an innovative automatic high-speed optical inspection system that enhances accuracy and efficiency in substrate examination.

Latest Patents: Harney's notable patent focuses on an automatic high-speed optical inspection system, utilizing TDI (Time Delay and Integration) sensors. This system efficiently images portions of interest on substrates that are uniformly or critically illuminated. The invention compares substrate characteristics to pre-stored expected features in one configuration. In another, it inspects patterns on a substrate by sequentially comparing them, ensuring comprehensive verification of image quality. The technique proves essential in die-to-die inspections and repeats pattern inspections, showcasing significant advancements in the field.

Career Highlights: Although specifics about his current position are minimal, Harney's work in developing innovative inspection systems is noteworthy. His patent stands as a testament to his commitment to advancing optical technology, enhancing both precision and speed in inspections.

Collaborations: David J. Harney has collaborated with esteemed professionals in the field, including Curt H. Chadwick and Robert R. Sholes. Their collective expertise has likely contributed to the refinement and success of Harney’s innovative endeavors.

Conclusion: David J. Harney's contributions to the field of optical inspection technology reflect his dedication to innovation and excellence. His patent on the automatic high-speed optical inspection system not only showcases his ingenuity but also promises to influence future advancements in the inspection processes of substrates. As technology evolves, inventors like Harney continue to pave the way for exciting developments in the industry.

This text is generated by artificial intelligence and may not be accurate.
Please report any incorrect information to support@idiyas.com
Loading…