Company Filing History:
Years Active: 2005-2025
Title: David Eric Berman Lees: Innovator in Focal Plane Array Technology
Introduction
David Eric Berman Lees is a notable inventor based in Lexington, MA (US). He has made significant contributions to the field of imaging technology, particularly in the development of methods for non-uniformity correction in focal plane arrays. With a total of 5 patents to his name, his work has had a considerable impact on the industry.
Latest Patents
One of his latest patents focuses on a method for non-uniformity correction for focal plane arrays. This method involves imaging a first graybody with a focal plane array (FPA), where the first graybody has a specific emissivity. It also includes imaging a second graybody that has a lower emissivity than the first. The data captured during these imaging processes is utilized to perform non-uniformity correction (NUC) of the FPA, enhancing the accuracy and reliability of imaging systems.
Career Highlights
Throughout his career, David has worked with prominent companies such as Goodrich Corporation and Safenet, Inc. His experience in these organizations has allowed him to refine his skills and contribute to innovative projects in imaging technology.
Collaborations
David has collaborated with notable professionals in his field, including Daniel Wyschogrod and Alain Arnaud. These partnerships have fostered a creative environment that has led to advancements in technology.
Conclusion
David Eric Berman Lees is a distinguished inventor whose work in focal plane array technology has paved the way for advancements in imaging systems. His contributions continue to influence the industry and inspire future innovations.