Company Filing History:
Years Active: 2011
Title: David E Kloster: Innovator in Semiconductor Testing
Introduction
David E Kloster is a notable inventor based in Austin, TX (US). He has made significant contributions to the field of semiconductor testing, particularly in the area of soft defect localization. His innovative approach has paved the way for advancements in the reliability and performance of semiconductor chips.
Latest Patents
David E Kloster holds a patent for "Wide area soft defect localization." This patent describes various apparatus and methods for testing a semiconductor chip for soft defects. The method involves applying an external stimulus to a series of fractional portions of the chip's surface, which perturbs the underlying circuit structures. This testing process helps determine the presence of soft defects in the semiconductor chip.
Career Highlights
David E Kloster is associated with Advanced Micro Devices Corporation, a leading company in the semiconductor industry. His work focuses on enhancing the testing methodologies for semiconductor chips, ensuring that they meet high standards of quality and performance. His patent reflects his commitment to innovation in this critical field.
Collaborations
David has collaborated with notable colleagues such as Ronald M Potok and Rama Rao Goruganthu. These collaborations have contributed to the development of advanced testing techniques and methodologies in semiconductor technology.
Conclusion
David E Kloster's contributions to semiconductor testing through his innovative patent demonstrate his expertise and commitment to advancing technology. His work continues to influence the industry and improve the reliability of semiconductor devices.