Clintondale, NY, United States of America

David E Dybas

This inventor holds 1 USPTO granted patent. Top assignee: International Business Machines Corporation. Active years: 1993.


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 22(Granted Patents)


Company Filing History:


Years Active: 1993

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1 patent (USPTO):Explore Patents

Title: David E Dybas: Innovator in Portable Particle Detection

Introduction

David E Dybas is a notable inventor based in Clintondale, NY (US). He has made significant contributions to the field of semiconductor manufacturing through his innovative work. His expertise lies in developing technologies that enhance the efficiency and reliability of semiconductor processes.

Latest Patents

David holds a patent for a "Portable Particle Detector Assembly." This invention is designed to detect particle contamination in the reaction chamber of a plasma processing tool used in semiconductor manufacture. The detector features a scanner assembly that provides a scanned laser beam, along with a video camera positioned opposite the scanner to monitor light scattered by particles within the volume of the reaction chamber. This technology plays a crucial role in ensuring the cleanliness and integrity of semiconductor manufacturing processes.

Career Highlights

David E Dybas is associated with International Business Machines Corporation, commonly known as IBM. His work at IBM has allowed him to collaborate with other talented professionals in the field. His contributions have been instrumental in advancing particle detection technologies.

Collaborations

David has worked alongside notable colleagues such as Kurt L Haller and Edward F Patterson. Their combined expertise has fostered innovation and development in their respective areas of research.

Conclusion

David E Dybas is a distinguished inventor whose work in portable particle detection has made a significant impact on semiconductor manufacturing. His innovative spirit and collaboration with other experts continue to drive advancements in this critical field.

Profile summary based on public USPTO records.
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