Cambridge, VT, United States of America

David B Lutton, Ii


Average Co-Inventor Count = 5.5

ph-index = 2

Forward Citations = 38(Granted Patents)


Location History:

  • Cambridge, VT (US) (2007 - 2016)
  • Cambrige, VT (US) (2016)

Company Filing History:


Years Active: 2007-2016

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4 patents (USPTO):Explore Patents

Title: The Innovative Contributions of David B Lutton, II

Introduction

David B Lutton, II is a notable inventor based in Cambridge, VT (US). He has made significant contributions to the field of integrated circuit testing, holding a total of 4 patents. His work focuses on developing advanced methods for adaptive testing, which are crucial for enhancing the reliability and efficiency of electronic devices.

Latest Patents

Among his latest patents is the "Real-time rule engine for adaptive testing of integrated circuits." This innovative method involves obtaining test data for a device testing program that evaluates the device's performance. An adaptation command for testing the device is determined at an adaptive testing engine using the obtained test data. This command is then sent from the adaptive testing engine to a tool control application, which utilizes the command to manage operations related to the device testing process.

Career Highlights

David B Lutton, II is currently employed at International Business Machines Corporation (IBM), where he continues to push the boundaries of technology through his inventive work. His career at IBM has allowed him to collaborate with other talented professionals in the field, further enhancing his contributions to innovation.

Collaborations

Some of his notable coworkers include Kerry J Enright and Thomas D Furland. Their collaborative efforts have likely played a role in advancing the projects they work on together.

Conclusion

David B Lutton, II exemplifies the spirit of innovation in the technology sector. His patents and work at IBM highlight his commitment to improving integrated circuit testing methods. His contributions are invaluable to the ongoing evolution of electronic device reliability and performance.

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