Fullerton, CA, United States of America

Dave Helsel



Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 23(Granted Patents)


Company Filing History:


Years Active: 2004

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1 patent (USPTO):Explore Patents

Title: **Dave Helsel: Innovating Fly Height Measurement Technology**

Introduction

Dave Helsel, an inventive mind based in Fullerton, California, holds a noteworthy patent that significantly contributes to the field of data storage technology. His work at Texas Instruments Corporation showcases his expertise and dedication to innovation. With one patent to his name, Helsel has made strides in understanding the intricacies of fly height measurement.

Latest Patents

Helsel's patent, titled "Head fly height by using the applied peak area ratio to determine signal PW50," is a testament to his innovative spirit. This invention encompasses a circuit and method for determining fly height based on a parameter known as PW50. The technology utilizes a signal to measure PW50 by detecting the peak height and area of the signal. By calculating the ratio of the peak height to the area, this innovative method provides an insightful indication of PW50, which corresponds directly to the fly height, enhancing the precision of data storage devices.

Career Highlights

Throughout his career at Texas Instruments Corporation, Helsel has focused on developing innovative solutions that impact various aspects of technology. His contributions have helped enhance the precision of data transfer processes, reinforcing the importance of accurate measurements in high-performance environments.

Collaborations

Helsel has collaborated with esteemed colleagues in his field, including James M. Aralis and Dino J. Pollalis. This collaboration has fostered a rich environment for innovation, allowing for a cross-pollination of ideas that empowers the continuous development of cutting-edge technology at Texas Instruments.

Conclusion

Dave Helsel's work exemplifies the spirit of innovation within the technological landscape. With his patent focusing on head fly height measurement, he has taken significant steps towards refining the mechanisms that allow for enhanced performance in data storage technology. His collaborations and contributions within Texas Instruments Corporation mark him as a pivotal figure in this ever-evolving industry.

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