Company Filing History:
Years Active: 2021-2023
Title: Darrick Hay: Innovator in Optical Metrology
Introduction
Darrick Hay is a notable inventor based in Brandon, FL (US). He has made significant contributions to the field of optical metrology, particularly in the measurement of vectorial optical fields. With a total of 2 patents, his work has implications across various applications, including microscopy and communication.
Latest Patents
Darrick Hay's latest patents include a measurement apparatus designed to analyze the wavefront and polarization profile of vectorial optical fields. This innovative apparatus measures the transverse profile of vectorial optical field beams, capturing both the phase and polarization spatial profile. The device comprises a polarization separation module, a weak perturbation module, and a detection module. By characterizing the transverse profile of vector fields, this apparatus serves as a vital optical metrology tool for fundamental studies and a wide range of applications, such as surveillance, imaging, material processing, and laser trapping.
Career Highlights
Darrick Hay is affiliated with the University of South Florida, where he continues to advance research in optical technologies. His work has garnered attention for its potential to enhance various scientific and industrial applications.
Collaborations
Darrick collaborates with esteemed colleagues, including Zhimin Shi and Ziyi Zhu, contributing to a dynamic research environment that fosters innovation and discovery.
Conclusion
Darrick Hay's contributions to optical metrology through his patents and research at the University of South Florida highlight his role as a significant inventor in the field. His work continues to pave the way for advancements in optical technologies and their applications.