Darin J Leahy

Title: The Innovative Contributions of Darin J Leahy in Detecting Defects

Introduction

Darin J Leahy is a notable inventor based in Stoneham, MA, whose contributions to the field of materials science have significant implications for industries relying on the integrity of solid materials. With one patent to his name, his innovative approach to imaging defects in solid materials, including semiconductor wafers, marks a significant advancement in nondestructive testing methods.

Latest Patents

Darin J Leahy's patent, titled "Locating Defects in Solid Material," offers a groundbreaking method and apparatus for the fast, accurate, and nondestructive imaging of defects. This invention facilitates the detection of defect densities in semiconductor wafers through a method where the wafer is illuminated on one side by an infrared (IR) source. A camera positioned on the opposite side captures the IR radiation transmitted through the wafer. Notably, the method employs an imaging camera, like a focal plane array camera, which images the illuminated wafer. The design of this approach allows for a significant focus on wavelengths that reveal precipitates, subsurface defects, and residual polishing damage, enhancing the reliability of material assessments.

Career Highlights

Darin J Leahy is associated with the United States of America as represented by the Secretary of the Air Force, where his expertise plays a crucial role in advancing materials science and engineering. His innovative work not only impacts military applications but also extends to various civil industries that demand high-quality solid materials.

Collaborations

Throughout his career, Leahy has collaborated with esteemed colleagues such as Maxwell M Chi and Jonathan M Mooney. These partnerships exemplify the collaborative nature of scientific research, where sharing knowledge and expertise leads to impactful innovations.

Conclusion

Darin J Leahy’s contributions to the detection and imaging of defects in solid materials showcase the critical role of inventors in pushing the boundaries of technology. His patent represents an essential tool for industries that require precise assessments of material integrity, thus reinforcing the need for continued innovation in the field. As he continues to collaborate and develop his research, Leahy's work will undoubtedly influence future advancements and applications in materials science.