Company Filing History:
Years Active: 1995-1998
Title: Daphna R Yaniv: Innovator in Atomic Force Microscopy
Introduction
Daphna R Yaniv is a notable inventor based in Scottsdale, AZ (US). She has made significant contributions to the field of microscopy, particularly through her innovative patents. With a total of three patents to her name, her work has advanced the capabilities of atomic force microscopy.
Latest Patents
One of her latest patents is an atomic force microscope employing beam-tracking. This invention involves a scanning probe microscope designed to measure features of a sample surface using a sharp probe. The technology utilizes a collimated light beam reflected from a responsive reflective surface, which detects the movement of the probe relative to the sample surface. The scanner in this design has one end fixed and another end free, allowing for precise movement of the sharp probe. Additionally, a beam tracking lens is integrated into the system to ensure that the focus spot of the light beam tracks the translational movement of the reflective surface. This innovation accommodates a wide range of scanning areas, up to about 100 times 100 square micrometers, without disturbing the sample.
Career Highlights
Daphna has worked with several companies throughout her career, including Molecular Imaging Corporation and Molecular Imaging Systems. Her experience in these organizations has contributed to her expertise in the field of microscopy and imaging technologies.
Collaborations
Daphna has collaborated with various professionals in her field, including her coworker Pan S Jung, who is also a woman. Their joint efforts have likely fostered advancements in their respective projects.
Conclusion
Daphna R Yaniv's contributions to atomic force microscopy exemplify her innovative spirit and dedication to advancing scientific research. Her patents reflect her commitment to enhancing the capabilities of microscopy technologies.