Daniel J Kenway

Title: The Innovative Contributions of Daniel J Kenway

Introduction

Daniel J Kenway is a notable inventor based in Edmonton, Canada. He has made significant contributions to the field of technology with his innovative patents. With a total of 2 patents, Kenway has focused on developing advanced systems for flaw detection in various materials.

Latest Patents

Kenway's latest patents include a method for defect detection in articles using computer-modeled dissipation correction differential time delayed far infrared scanning. This process involves the infrared scanning of an article as its temperature changes, allowing for the comparison of infrared scans to identify irregularities in cooling or heating patterns. When irregularities are detected, thermodynamic modeling is employed to establish a hypothetical cooling or heating pattern for an unflawed article. Another significant patent is the egg candling system, which utilizes a vibrating light beam, such as a laser, to scan the surface of an egg for flaws like pinholes, cracks, and thinned shell regions. This innovative approach allows for the identification of flaws based on the characteristics of the light progression emanating from the egg.

Career Highlights

Throughout his career, Kenway has worked with various companies, including Osb Scan Inc. and FPS Food Processing Systems, Inc. His experience in these organizations has contributed to his expertise in developing advanced detection systems.

Collaborations

Kenway has collaborated with notable individuals in his field, including Frank L Weichman and Jelle Van Der Schoot. These collaborations have likely enhanced his innovative capabilities and contributed to his successful patent applications.

Conclusion

Daniel J Kenway's contributions to technology through his patents demonstrate his commitment to innovation and problem-solving. His work in defect detection systems showcases the potential for advancements in various industries.