Company Filing History:
Years Active: 2020
Title: The Innovative Contributions of Dan Dinh
Introduction
Dan Dinh is a notable inventor based in Savage, MN (US). He has made significant contributions to the field of metrology through his innovative techniques. His work focuses on enhancing the accuracy of topographical characterizations of workpieces.
Latest Patents
Dan Dinh holds a patent for a metrology technique that provides true flattening. This patent describes an apparatus and method for topographically characterizing a workpiece. The method includes scanning a first surface of a workpiece with a scanning probe at a first resolution to derive a first topographical image. It also involves performing a refining operation on the first topographical image to obtain a true first topographical image. Furthermore, the method includes scanning a surface of interest of the workpiece at a higher resolution to derive a second topographical image, which is then scaled down to match the first resolution. A pattern recognition operation is performed to match the scaled-down second topographical image to a corresponding sub-portion of the true first topographical image, allowing for refinement of the second topographical image.
Career Highlights
Dan Dinh is currently employed at Seagate Technology Incorporated, where he applies his expertise in metrology. His innovative approach has led to advancements in the accuracy and efficiency of workpiece characterization.
Collaborations
Dan has collaborated with notable colleagues, including Zhiyong Xiao and Gary Joseph Kunkel. Their combined efforts contribute to the ongoing development of innovative technologies in their field.
Conclusion
Dan Dinh's contributions to metrology and his innovative patent demonstrate his commitment to advancing technology. His work continues to influence the industry and improve the accuracy of topographical measurements.