Katy, TX, United States of America

D James Siebert


Average Co-Inventor Count = 4.4

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2013-2016

Loading Chart...
2 patents (USPTO):Explore Patents

Title: D James Siebert: Innovator in Geological Resistivity and Resource Location

Introduction

D James Siebert is a notable inventor based in Katy, TX (US), recognized for his contributions to the field of geological analysis. With a total of 2 patents, he has developed innovative methods that leverage lightning data to enhance the understanding of geological materials and locate natural resources.

Latest Patents

One of Siebert's latest patents is a "Method for determining geological surface and subsurface resistivity." This method involves obtaining a set of lightning parameters associated with a lightning strike received by a geological volume of material. The parameters include an indicium of the current of the lightning strike at a first initial time and an indicium of the current at a first decay time. This information is used to infer the resistance of the geological material. Another significant patent is the "Method for locating sub-surface natural resources," which utilizes lightning data to identify likely locations for finding these resources.

Career Highlights

Throughout his career, D James Siebert has worked with various companies, including Vaisala Oyj and Dynamic Measurement, LLC. His work has significantly impacted the methods used in geological assessments and resource exploration.

Collaborations

Siebert has collaborated with notable professionals in his field, including H Roice Nelson, Jr. and Joseph H Roberts. These collaborations have contributed to the advancement of his innovative methods.

Conclusion

D James Siebert's work exemplifies the intersection of natural phenomena and technological innovation in geological studies. His patents reflect a commitment to enhancing resource location and understanding geological resistivity through unique methodologies.

This text is generated by artificial intelligence and may not be accurate.
Please report any incorrect information to support@idiyas.com
Loading…