Company Filing History:
Years Active: 2018
Title: Cyrille Lambert: Innovator in Integrated Circuit Testing
Introduction
Cyrille Lambert is a notable inventor based in Meyreuil, France. He has made significant contributions to the field of integrated circuit testing, showcasing his expertise through his innovative patent.
Latest Patents
Cyrille Lambert holds a patent for a "Tester for integrated circuits on a silicon wafer." This invention includes an input/output connection for testing an integrated circuit. The tester is designed with circuitry that transfers a first data frame to the integrated circuit via the input/output connection. The first data frame contains a time reference for the data included, a field for validating the time reference, and a data field that includes at least one test command. Additionally, it is capable of receiving a second data frame via the input/output connection, with the data in the second data frame having a duration that is a multiple of the time reference. Cyrille has 1 patent to his name.
Career Highlights
Cyrille Lambert is currently employed at Starchip, where he continues to develop and refine technologies related to integrated circuits. His work at Starchip has positioned him as a key player in the advancement of testing methodologies for integrated circuits.
Collaborations
Cyrille collaborates with talented individuals such as Sébastien Bayon and Alexandre Croguennec, contributing to a dynamic work environment that fosters innovation and creativity.
Conclusion
Cyrille Lambert's contributions to integrated circuit testing exemplify his dedication to innovation in technology. His patent and work at Starchip highlight his role as a significant inventor in the field.