Craig M Bocash

Title: Craig M Bocash: Innovator in Test Probe Technology

Introduction

Craig M Bocash is a notable inventor based in Winooski, Vermont. He has made significant contributions to the field of test probe technology, particularly with his innovative designs that enhance the functionality and repairability of test probe systems.

Latest Patents

Craig M Bocash holds a patent for a "Repairable Rigid Test Probe Card Assembly." This invention features a repairable rigid test probe system that includes an annular gimbal supported by an annular gimbal bearing of a probe card assembly. The design incorporates a test substrate that is seated and aligned within the annular gimbal, along with a rigid die that contains an array of through holes. Each of the rigid probes is designed to contact connections on a test substrate and a device under test, showcasing a thoughtful approach to improving test probe efficiency.

Career Highlights

Throughout his career, Craig has demonstrated a commitment to innovation in the semiconductor industry. His work at Globalfoundries Inc. has positioned him as a key player in advancing test probe technology. With a focus on creating repairable systems, he has contributed to the development of more sustainable and efficient testing methods.

Collaborations

Craig has collaborated with esteemed colleagues, including David Lewis Gardell and Peter W Neff. These partnerships have fostered a collaborative environment that encourages the exchange of ideas and innovation in their field.

Conclusion

Craig M Bocash's contributions to test probe technology exemplify his dedication to innovation and improvement in the semiconductor industry. His patent for a repairable rigid test probe card assembly highlights his ability to create solutions that enhance testing efficiency and sustainability.