Location History:
- Leuven, BE (2020)
- Bertem, BE (2023)
Company Filing History:
Years Active: 2020-2023
Title: Claudia Fleischmann: Innovator in Scanning Probe Microscopy
Introduction
Claudia Fleischmann is a prominent inventor based in Leuven, Belgium. She has made significant contributions to the field of scanning probe microscopy, holding 2 patents that showcase her innovative approaches to aligning probes and determining sample shapes.
Latest Patents
Her latest patents include a "Method and apparatus for aligning a probe for scanning probe microscopy to the tip of a pointed sample." This invention relates to methods and apparatuses for aligning a probe for scanning probe microscopy (SPM) to the tip of a pointed sample. One embodiment includes a method for aligning an SPM probe to an apex area of a free-standing tip of a pointed sample. The method involves providing an SPM apparatus that includes the SPM probe, a sample holder, a drive mechanism, and detection, control, and representation tools for acquiring and representing an image of a surface scanned by the SPM probe. The process includes mounting the sample on the sample holder, positioning the probe tip of the SPM, determining a 2-dimensional area that includes the pointed sample, performing an SPM acquisition scan, evaluating the acquired image, and placing the SPM probe in a position where it is aligned with the apex area of the free-standing tip of the pointed sample.
Another notable patent is the "Method for determining the shape of a sample tip for atom probe tomography." This technology relates to a method and apparatus for correctly positioning a probe suitable for scanning probe microscopy (SPM). The probe is positioned relative to the apex region of a needle-shaped sample, such as a sample for atom probe tomography, to perform an SPM acquisition of the apex region and obtain an image of the region. The positioning occurs through an iterative process, starting from a position where one side plane of the pyramid-shaped SPM probe interacts with the sample tip. Controlled consecutive scans in two orthogonal directions allow the SPM probe tip to approach and finally reach a position where a tip area of the probe interacts with the sample tip's apex region.
Career Highlights
Claudia has worked with notable organizations such as Imec and Katholieke Universiteit Leuven, also known as KU Leuven R&D. Her work in these institutions has significantly advanced the field of microscopy and materials science.
Collaborations
Throughout her career, Claudia has collaborated with esteemed colleagues, including Kristof