Nesles La Vallee, France

Claude Leclerco


Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 1994

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1 patent (USPTO):Explore Patents

Title: Claude Leclerco: Innovator in Electro-Optical Modulation Gyroscopes

Introduction

Claude Leclerco is a notable inventor based in Nesles La Vallee, France. He has made significant contributions to the field of gyroscopic technology, particularly through his innovative designs that utilize the Sagnac effect. His work has implications for various applications in navigation and measurement systems.

Latest Patents

Leclerco holds a patent for an "Interferometer gyroscope with electro-optical modulation and reduced." This gyroscope is based on the Sagnac effect and features a coiled dielectric waveguide. It includes a source of electromagnetic waves equipped with a splitter that sends two contrarotating waves around the ring. An interference detector receives these waves, while an electro-optical modulator imparts periodic alternating and symmetrical phase modulation to the waves. The modulator is strategically placed upstream for one wave and downstream for the other, enhancing the device's functionality.

Career Highlights

Claude Leclerco is associated with the company Société d'Applications Générales d'Électricité, where he has been instrumental in advancing gyroscopic technologies. His innovative approach has led to the development of sophisticated measurement systems that leverage the principles of electro-optical modulation.

Collaborations

Leclerco has worked alongside Jacques Rochereau, contributing to the advancement of their shared projects in the field of electro-optical systems. Their collaboration has fostered innovation and development in gyroscopic technology.

Conclusion

Claude Leclerco's contributions to the field of gyroscopic technology through his patent and collaborative efforts highlight his role as a significant inventor. His work continues to influence advancements in navigation and measurement systems.

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