Company Filing History:
Years Active: 2013
Title: Ciaran Eoin Stewart: Innovator in Surface Plasmon Ellipsometry
Introduction
Ciaran Eoin Stewart is a notable inventor based in Devon, GB. He has made significant contributions to the field of surface plasmon ellipsometry, particularly through his innovative methods that enhance the sensitivity of analytical apparatus.
Latest Patents
Ciaran holds a patent for a "Method of optimising the sensitivity of a surface plasmon ellipsometry apparatus." This patent discloses a method that optimizes the sensitivity of surface plasmon ellipsometry (SPE) apparatus used to analyze surfaces comprising conducting films. The method involves calculating a sensitivity map that defines variations in sensitivity based on the angle of incidence and polarization angle of polarized light. By utilizing this sensitivity map, the apparatus can be configured to operate in a region of maximum sensitivity, thereby improving its analytical capabilities.
Career Highlights
Ciaran Eoin Stewart is associated with Attomarker Limited, where he applies his expertise in surface plasmon ellipsometry. His work has contributed to advancements in the field, particularly in enhancing the performance of analytical instruments.
Collaborations
Ciaran has collaborated with notable colleagues, including Ian Richard Hooper and John Roy Sambles. Their collective efforts have furthered research and development in the area of surface plasmon ellipsometry.
Conclusion
Ciaran Eoin Stewart is a distinguished inventor whose work in optimizing surface plasmon ellipsometry has made a significant impact in the field. His innovative methods and collaborations continue to advance analytical technologies.