Company Filing History:
Years Active: 2023
Title: Innovations of Chun-Wen Liang in 2D Material Analysis.
Introduction
Chun-Wen Liang is a notable inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of material science, particularly in the analysis of 2D material thin films. His innovative approach has led to the development of a unique method and system that enhances the understanding and application of these materials.
Latest Patents
Chun-Wen Liang holds a patent for a "Method and system for analyzing 2D material thin film." This patent describes a comprehensive detection method that includes capturing sample images of 2D material thin films and measuring them using a Raman spectrometer. The process involves performing a visible light hyperspectral algorithm on the sample images to generate multiple hyperspectral images. Furthermore, it includes a training and validation procedure to establish a thin film prediction model, which is crucial for analyzing the thin film images captured by an optical microscope.
Career Highlights
Chun-Wen Liang is affiliated with National Chung Cheng University, where he continues to advance research in material science. His work has garnered attention for its innovative methodologies and practical applications in analyzing 2D materials.
Collaborations
Chun-Wen Liang collaborates with esteemed colleagues such as Hsiang-Chen Wang and Kai-Chun Li. Their combined expertise contributes to the advancement of research in the field of 2D materials.
Conclusion
Chun-Wen Liang's contributions to the analysis of 2D material thin films exemplify the importance of innovation in material science. His patented methods and collaborative efforts continue to push the boundaries of research and application in this exciting field.