Company Filing History:
Years Active: 1995-1996
Title: Christopher M Fleck: Innovator in Fiber Optic and Circuit Testing Technologies
Introduction
Christopher M Fleck is a notable inventor based in Boca Raton, FL (US). He has made significant contributions to the fields of fiber optic testing and circuit trace analysis. With a total of 2 patents, his work has advanced the technology used in these critical areas.
Latest Patents
Fleck's latest patents include a "Method and apparatus for testing fiber optic jumpers." This invention features a station designed for testing fiber optic jumper cables, which includes four indexing plugboard stations. The design allows for a single cable to be tested by connecting it between two plugboard stations. Each station is equipped with plug positions that correspond to various connector styles, facilitating a comprehensive testing process. The system is controlled by a computer that manages the indexing of the plugboard stations, ensuring a preferred sequence of tests.
Another significant patent is the "Split-fixture configuration and method for testing circuit traces on a flexible substrate." This fixture is designed to locate open conditions and short conditions within circuits on a flexible substrate. It employs conductivity and capacitance measurements to detect issues, enhancing the reliability of circuit testing.
Career Highlights
Christopher M Fleck is currently employed at International Business Machines Corporation (IBM). His role at IBM has allowed him to work on innovative projects that push the boundaries of technology in fiber optics and circuit testing.
Collaborations
Fleck has collaborated with notable coworkers such as Wayne A Barringer and Casimer M DeCusatis. Their combined expertise has contributed to the successful development of advanced testing technologies.
Conclusion
Christopher M Fleck's contributions to the fields of fiber optics and circuit testing are noteworthy. His innovative patents and work at IBM highlight his role as a leading inventor in these technological domains.