Company Filing History:
Years Active: 2010
Title: Christopher Eisele: Innovator in Optical Position-Measuring Systems
Introduction
Christopher Eisele is a notable inventor based in Traunwalchen, Germany. He has made significant contributions to the field of optical position-measuring systems. His innovative work has led to the development of a unique scanning head that enhances the accuracy and efficiency of these systems.
Latest Patents
Eisele holds a patent for a "Scanning head for optical position-measuring systems." This invention features a receiver grating composed of photosensitive areas that scan locally intensity-modulated light of varying wavelengths. The receiver grating is constructed from a semiconductor layer stack, which includes a doped p-layer, an intrinsic i-layer, and a doped n-layer. The individual photosensitive areas share a first doped layer and a portion of the intrinsic layer, while being electrically isolated from one another by interruptions in the second doped layer. This innovative design allows for improved performance in optical measurements.
Career Highlights
Christopher Eisele is currently employed at Dr. Johannes Heidenhain GmbH, a company renowned for its precision measurement and control technology. His work at this organization has allowed him to further develop his expertise in optical systems and contribute to cutting-edge technologies.
Collaborations
Eisele has collaborated with several talented individuals in his field, including Peter Speckbacher and Josef Weidmann. These collaborations have fostered a creative environment that encourages innovation and the sharing of ideas.
Conclusion
Christopher Eisele's contributions to optical position-measuring systems exemplify the spirit of innovation. His patent and work at Dr. Johannes Heidenhain GmbH highlight his commitment to advancing technology in this field.