Company Filing History:
Years Active: 2006
Title: Innovations by Ching Peng Teong in Semiconductor Testing
Introduction
Ching Peng Teong is a notable inventor based in Singapore, recognized for his contributions to the field of semiconductor testing. With a focus on improving the efficiency and accuracy of testing integrated circuit devices, Teong has developed innovative methods that enhance the testing process.
Latest Patents
Teong holds a patent for a "Method for testing semiconductor devices and an apparatus therefor." This invention discloses a method for testing integrated circuit devices and loading such devices into a test board for further testing. The method allows for selection between two modes of operation. In the first mode, the integrated circuit devices are subjected to an electrical test before being placed into the test board for further testing. In the second mode, the integrated circuit devices are tested after being placed in the test board. The apparatus allows for the selection between the first mode and the second mode. In either mode, information about the tested devices and the sockets in the test board is used to load the test boards intelligently. Intelligent loading ensures that devices under test (DUTs) are not placed in bad sockets, and devices that do test bad are removed from the test board, with an option of replacing the failed DUT with another DUT before subsequent environmental testing of the DUTs in the test board is carried out. Teong's innovative approach has led to the issuance of 1 patent.
Career Highlights
Ching Peng Teong is currently employed at Kes Systems, Inc., where he continues to work on advancements in semiconductor technology. His expertise in testing methodologies has made a significant impact on the efficiency of semiconductor testing processes.
Collaborations
Teong collaborates with talented individuals such as Ballson Gopal and Samuel Syn Soo Lim, contributing to a dynamic work environment that fosters innovation and creativity.
Conclusion
Ching Peng Teong's contributions to semiconductor testing through his innovative patent demonstrate his commitment to advancing technology in this critical field. His work not only enhances testing efficiency but also sets a standard for future developments in semiconductor device testing.