Chi-Ming Yam

Title: Innovations of Chi-Ming Yam in Silicon Cantilever Technology

Introduction

Chi-Ming Yam is an accomplished inventor based in Stafford, Texas. He has made significant contributions to the field of atomic force microscopy through his innovative patent. His work focuses on the development of short and thin silicon cantilevers, which are essential for high-resolution imaging and force measurement.

Latest Patents

Chi-Ming Yam holds a patent for a "Short and thin silicon cantilever with tip and fabrication thereof." This invention addresses the need for cantilevers that possess both a low force constant and a high resonance frequency. Such characteristics make them highly desirable for atomic force microscope (AFM) applications. The patent describes small silicon cantilevers integrated with a silicon tip, fabricated from silicon-on-insulator (SOI) wafers. This fabrication process allows for the production of SOI chips containing multiple silicon cantilevers, which significantly enhance imaging resolution compared to commercial tips. The cantilevers are particularly suitable for imaging soft biological samples due to their reduced force constants.

Career Highlights

Chi-Ming Yam is affiliated with the University of Houston System, where he continues to advance research in the field of nanotechnology. His innovative approach to cantilever design has positioned him as a key figure in the development of tools for biological imaging and measurement.

Collaborations

Chi-Ming Yam has collaborated with notable colleagues, including Chengzhi Cai and Guoting Qin. Their combined expertise contributes to the advancement of research in silicon cantilever technology.

Conclusion

Chi-Ming Yam's contributions to the field of atomic force microscopy through his patented innovations in silicon cantilevers demonstrate his commitment to enhancing imaging techniques. His work not only improves the resolution of biological samples but also paves the way for future advancements in nanotechnology.