Company Filing History:
Years Active: 1999
Title: Inventor Spotlight: Charles William Griffin
Introduction
Charles William Griffin, an accomplished inventor, resides in Underhill, Vermont, USA. He is credited with a patent that enhances the reliability testing of integrated circuits, showcasing a blend of innovation and engineering insight.
Latest Patents
Griffin's notable patent, titled "Structure and method for reliability stressing of dielectrics," focuses on an apparatus and method designed specifically for reliability testing of integrated circuits. The invention involves a unique test structure that integrates a self-heating gate structure with the product, allowing for more effective testing of gate and node dielectrics. This method utilizes selected conductive lines within the integrated circuit as heater elements, facilitating temperature stressing that compensates for the challenges posed by low-voltage technologies.
Career Highlights
Griffin is currently associated with the International Business Machines Corporation (IBM), where he applies his expertise in electrical engineering and materials science. His work on reliability testing significantly impacts the development of more resilient electronic components geared towards modern technological applications.
Collaborations
During his career, Griffin has collaborated with notable peers such as Roger Aime Dufresne and Chorng-Lii Hwang. These collaborations have undoubtedly fostered innovation and advancement in the field of integrated circuit design and reliability testing.
Conclusion
Charles William Griffin represents the spirit of innovation in the realm of integrated circuits. His patent not only reflects his individual talent but also highlights the collaborative efforts within IBM, which strive to push the boundaries of technology. As research and development continue to evolve, Griffin’s contributions will remain significant in enhancing the reliability of electronic devices.