Company Filing History:
Years Active: 2010
Title: Innovations by Charles Van Lingen
Introduction
Charles Van Lingen is an accomplished inventor based in Sheffield, CA. He has made significant contributions to the field of electrical engineering, particularly in the area of S-parameter measurement systems. His innovative approach has led to the development of a unique method for tracking calibration in scattering parameter test systems.
Latest Patents
Charles holds a patent for a "Method and system for tracking scattering parameter test system calibration." This invention describes methods of correcting S-parameter measurements for a Device Under Test (DUT). The method involves coupling at least one tracking module associated with a set of electrical standards to an S-parameter measurement device to form a test system. An initial calibration for the test system is determined by measuring the S-parameters of the electrical standards and generating calibrations along both a calibration plane and a correction plane. The DUT is then coupled to the test system, and the S-parameters of the DUT are measured. Changes in the initial calibration are tracked using the tracking modules, which include measuring the S-parameters of the electrical standards and generating corrected calibration plane calibrations.
Career Highlights
Charles Van Lingen has made a notable impact in his field through his work at Com Dev International, Inc. His expertise in S-parameter measurement systems has positioned him as a key figure in the development of advanced calibration methods. His innovative solutions have enhanced the accuracy and reliability of measurements in various applications.
Collaborations
Some of Charles's coworkers include Xavier M H Albert-Lebrun and Mario Lisi. Their collaborative efforts contribute to the innovative environment at Com Dev International, Inc., fostering advancements in technology and engineering.
Conclusion
Charles Van Lingen's contributions to the field of electrical engineering, particularly through his patented methods for tracking calibration in S-parameter measurement systems, highlight his role as a significant inventor. His work continues to influence advancements in measurement technology.