Company Filing History:
Years Active: 1997-2003
Title: The Innovations of Charles C Prain, III
Introduction
Charles C Prain, III is an accomplished inventor based in Oxford, MI (US). He holds two patents that showcase his expertise in measuring surface quality and visual characteristics of various workpieces. His innovative approaches have contributed significantly to the field of optical measurement.
Latest Patents
Prain's latest patents include a "Multi-beam apparatus for measuring surface quality" and a "Multi-parameter scanning system with moveable field mask." The first patent describes an apparatus that utilizes two separate light sources to measure the visual characteristics of a surface. One light source provides focused beams at a specific angle, while the other delivers unfocused beams at a different angle. The reflected beams converge onto a single photo detector, allowing for precise surface quality measurements such as gloss and distinctness of image.
The second patent outlines a scanning system that employs an illumination system to scan a beam of light across a surface. The reflected light is split into two parts, with one part going to a control sensor and the other to a measuring sensor. A field mask restricts the beam's cross-sectional area, enabling the selection of specularly reflected light for measurement. This innovative system can also determine the slope of the intensity of the reflected light, which is useful for calculating the haze value of the inspected surface.
Career Highlights
Throughout his career, Prain has worked with notable companies such as Amt Pte. Ltd. and ATI Systems, Inc. His experience in these organizations has allowed him to refine his skills and contribute to advancements in optical measurement technologies.
Collaborations
Prain has collaborated with Gregory R Wiles, further enhancing his work in the field of surface quality measurement. Their partnership has likely led to innovative solutions and improvements in their respective projects.
Conclusion
Charles C Prain, III is a notable inventor whose contributions to optical measurement technology have made a significant impact. His patents reflect his innovative spirit and dedication to advancing the field.