Chang-Yong Nam

Title: Chang-Yong Nam: Innovator in 2D Material Characterization

Introduction

Chang-Yong Nam is a notable inventor based in Upton, NY (US). He has made significant contributions to the field of materials science, particularly in the characterization of two-dimensional (2D) materials. His innovative work has implications for various applications in microscopy and material analysis.

Latest Patents

Chang-Yong Nam holds 1 patent for his invention titled "Substrates for optical and electron microscopy of 2D materials." This patent describes a substrate that consists of an ultrathin, conductive, shapeless metal oxide on a SiO/Si substrate. The substrate is designed to facilitate experimental characterization of 2D materials by enabling optical identification of single monolayer thickness and electron-based spectro-microscopy characterization.

Career Highlights

Chang-Yong Nam is affiliated with the U.S. Department of Energy, where he applies his expertise in materials science. His work focuses on advancing the understanding and application of 2D materials, which are critical in various technological advancements.

Collaborations

Some of his notable coworkers include Jerzy T Sadowski and Nikhil Tiwale. Their collaborative efforts contribute to the innovative research and development in the field of microscopy and materials characterization.

Conclusion

Chang-Yong Nam's contributions to the field of 2D materials and microscopy highlight his role as an influential inventor. His work continues to pave the way for advancements in material science and technology.