Cheonan, South Korea

Chang-Nyun Kim


Average Co-Inventor Count = 5.4

ph-index = 3

Forward Citations = 23(Granted Patents)


Location History:

  • Chungcheongnam-do, KR (2004)
  • Cheonan, KR (2004 - 2007)

Company Filing History:


Years Active: 2004-2007

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5 patents (USPTO):Explore Patents

Title: Innovations of Chang-Nyun Kim in Semiconductor Testing

Introduction

Chang-Nyun Kim is a notable inventor based in Cheonan, South Korea. He has made significant contributions to the field of semiconductor testing, holding a total of 5 patents. His work focuses on improving the efficiency and accuracy of testing semiconductor devices under actual operating conditions.

Latest Patents

One of his latest patents is a method and apparatus for testing semiconductor devices using the back side of a circuit board. This innovative test system allows the semiconductor device to be tested under real operating conditions while providing adequate clearance for automatic handling equipment. It also reduces signal delay and distortion. The system includes a circuit board designed to create an actual operating environment for the semiconductor device, such as a low-cost motherboard for testing memory devices. The device is connected to the back side of the circuit board through specially formed test terminals. An interface board is utilized to correct pin arrangements and compensate for environmental differences caused by additional equipment.

Another significant patent by Chang-Nyun Kim is a method and apparatus for testing semiconductor devices using an actual board-type product. This method allows semiconductor devices to be tested under real operating conditions by interfacing them with an actual board-type product. The test board includes a mounting unit that facilitates easy mounting and removal of the devices with minimal signal degradation. An interface circuit on the test board compensates for environmental differences, ensuring accurate testing results.

Career Highlights

Chang-Nyun Kim is currently employed at Samsung Electronics Co., Ltd., where he continues to innovate in the semiconductor testing domain. His work has been instrumental in advancing testing methodologies that enhance the reliability and performance of semiconductor devices.

Collaborations

Throughout his career, Chang-Nyun Kim has collaborated with talented individuals such as Sang-Jun Park and Jong-Hyun Kim. These collaborations have contributed to the development of cutting-edge technologies in the semiconductor industry.

Conclusion

Chang-Nyun Kim's contributions to semiconductor testing through his innovative patents have significantly impacted the industry. His work at Samsung Electronics Co., Ltd. exemplifies the importance of continuous innovation in technology.

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