Chan-An Pao

Title: Innovations of Chan-An Pao in Semiconductor Technology

Introduction

Chan-An Pao is a notable inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of semiconductor technology, particularly in the area of fault detection and classification systems. His innovative work has implications for improving the efficiency and reliability of semiconductor fabrication processes.

Latest Patents

Chan-An Pao holds a patent for a real-time fault detection and classification system used in semiconductor fabrication processes. This system integrates a computer integrated manufacturing (CIM) host that adheres to the SEMI equipment communication standard (SECS). It includes a semiconductor tool that executes the first sub-fabrication process and generates first status data, as well as a non-semiconductor tool that executes the second sub-fabrication process and generates second status data. The system transforms the second status data into third status data in conformity with the SECS, allowing the CIM host to classify the data and monitor equipment health conditions effectively. He has 1 patent to his name.

Career Highlights

Chan-An Pao is associated with the Industrial Technology Research Institute, where he has been instrumental in advancing semiconductor technologies. His work focuses on enhancing the reliability and performance of semiconductor manufacturing processes through innovative solutions.

Collaborations

Some of his notable coworkers include Yi-Chun Chang and Cheng-Tso Tsai, who have collaborated with him on various projects within the semiconductor field.

Conclusion

Chan-An Pao's contributions to semiconductor technology through his innovative patent demonstrate his commitment to advancing the industry. His work not only enhances manufacturing processes but also sets a foundation for future innovations in the field.