Location History:
- Los Gratos, CA (US) (2008)
- Los Gatos, CA (US) (2006 - 2010)
Company Filing History:
Years Active: 2006-2010
Title: Cecilia Martner: Innovator in Wafer Thickness Measurement
Introduction
Cecilia Martner is a prominent inventor based in Los Gatos, CA (US). She has made significant contributions to the field of measurement technology, particularly in the area of wafer thickness measurement. With a total of 3 patents to her name, her work has advanced the capabilities of precision measurement in various applications.
Latest Patents
Cecilia's latest patents include innovative methods and apparatuses for measuring the thickness of layers on substrates. One of her notable inventions is a method and apparatus for measuring the thickness of a layer of a wafer. This apparatus utilizes an eddy current sensor with first and second sensor heads positioned to create a predetermined gap for the test object. The sensor heads take measurements at specific sampling locations as the test object moves through the gap. Additionally, the apparatus features a position sensing mechanism to accurately determine the positions of these sampling locations. An evaluation circuit is also included to communicate with the eddy current sensor and the position sensing mechanism, allowing for precise thickness determination.
Another significant patent by Cecilia is the apparatus and method of dynamically measuring the thickness of a layer of a substrate. Similar to her previous invention, this apparatus employs an eddy current sensor and a position sensing mechanism to achieve accurate measurements of the test object's thickness at various sampling locations.
Career Highlights
Cecilia Martner is currently employed at Applied Materials, Inc., where she continues to innovate and develop advanced measurement technologies. Her work has been instrumental in enhancing the precision and efficiency of wafer thickness measurement, which is crucial in semiconductor manufacturing and other related fields.
Collaborations
Cecilia has collaborated with notable colleagues, including Lawrence C. Lei and Siqing Lu. These partnerships have contributed to the successful development and implementation of her innovative technologies.
Conclusion
Cecilia Martner is a trailblazer in the field of measurement technology, with her patents significantly impacting the industry. Her dedication to innovation and collaboration continues to drive advancements in wafer thickness measurement.