Colorado Springs, CO, United States of America

Brock J LaMeres


Average Co-Inventor Count = 2.6

ph-index = 5

Forward Citations = 218(Granted Patents)


Company Filing History:


Years Active: 2004-2009

Loading Chart...
13 patents (USPTO):Explore Patents

Title: Innovations by Brock J LaMeres

Introduction

Brock J LaMeres is a prominent inventor based in Colorado Springs, CO. He has made significant contributions to the field of probing technologies, holding a total of 13 patents. His work focuses on developing advanced probe accessories and methods that enhance the efficiency of testing electronic components.

Latest Patents

Among his latest patents are innovative designs for probe accessories that facilitate probing test points. These patents include methods for routing signals between a target and a test instrument using the probe accessories. The designs feature flexible circuits with multiple pairs of contacts, allowing for improved maneuverability and electrical coupling between test points and instruments. His inventions also encompass methods for probing inaccessible arrays of leads in VLSI IC packages, utilizing flexible printed circuits that can navigate tight spaces while maintaining contact with leads.

Career Highlights

Brock J LaMeres is currently employed at Agilent Technologies, Inc., where he continues to push the boundaries of probing technology. His expertise in flexible circuit design and probing methods has positioned him as a leader in the field. His patents reflect a deep understanding of the challenges faced in electronic testing and a commitment to providing innovative solutions.

Collaborations

Brock has collaborated with notable colleagues such as Brent Anthony Holcombe and Kenneth William Johnson. Their combined expertise has contributed to the successful development of advanced probing technologies.

Conclusion

Brock J LaMeres is a distinguished inventor whose work in probing technologies has led to numerous patents and innovations. His contributions continue to impact the field of electronic testing significantly.

This text is generated by artificial intelligence and may not be accurate.
Please report any incorrect information to support@idiyas.com
Loading…